In house analytical imaging & repair facilities provide a rapid turnaround service for failure analysis, process monitoring and IC repair using state of the art tools and experienced staff. Fabless design companies and the fabs themselves benefit from our analytical services, which are provided in a customer focused manner.

  

Available services

FIB cross sectioning
IC repair using FEI FIB200 XP Focused Ion Beam Workstation
FIB Cu metal etch capability
Pt and W deposition facilities
GDS2 CAD overlay on the IC image (CADNav)
AFM surface profiling
SEM failure analysis/process verification
Sample preparation for SEM microscopy
Deprocessing/De-encapsulation of devices
Reverse engineering capability

  X-ray fluorescence compositionnal analysis  

For further information on our Analytical tools please contact Dr Chris Huntley, chris.huntley@ed.ac.uk or complete the form below 

SMC Analytical Request